LUMIDAR Vis-NIR sensor, developed based on its proprietary PiNIR™ technology, can accurately capture subtle characteristic variations across the visible to near-infrared spectrum (0.3–1.4 μm). It is capable of penetrating silicon and other semiconductor materials to reveal internal structural information, including defects and inconsistencies. This capability can be applied in semiconductor manufacturing and solar cell inspection to enhance yield and efficiency.

LUMIDAR Vis-NIR image sensors empower the inspection robotics industry with perception capabilities beyond human vision and traditional visible-light cameras. This enables robots to maintain relatively clear vision and stable detection performance even in extreme industrial environments such as smoke, dust, low-light, or complete darkness.